Preparation and properties of p-type transparent conductive Cu-doped NiO films

The NiO–Cu composite films with various Cu contents of 0–18.17 at.% are deposited on a glass substrate. An ultra high electrical resistivity (ρ) is obtained and cannot be detected by a four point probe measurement when the Cu content in the films is lower than 6.97 at.%. The ρ value is reduced signi...

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Veröffentlicht in:	Thin solid films 2011-05, Vol.519 (15), p.4944-4947
Hauptverfasser:	Chen, S.C., Kuo, T.Y., Lin, Y.C., Lin, H.C.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Copper Crystallinity Cu-doped NiO films Degradation Deposition Electrical and optical properties Electrical resistivity Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic transport phenomena in thin films and low-dimensional structures Exact sciences and technology Halls Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics rf sputtering Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Thin films Transmittance
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