Narrow-beam X-ray tests of CCD edge response
The physical boundaries of a fully-depleted CCD can lead to distorted field lines and non-uniform response. We study this response with a beam of X-rays constrained to a width of less than one pixel (15 m), and a system to map the CCD response as a function of transverse position.
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Veröffentlicht in: | Exp. Aston 2011-04, Vol.29 (3), p.135-144 |
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Hauptverfasser: | , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | The physical boundaries of a fully-depleted CCD can lead to distorted field lines and non-uniform response. We study this response with a beam of X-rays constrained to a width of less than one pixel (15
m), and a system to map the CCD response as a function of transverse position. |
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ISSN: | 0922-6435 1572-9508 |
DOI: | 10.1007/s10686-010-9204-3 |