Investigation of the IC resistance to pulsed electromagnetic radiation

The results of the experimental investigation of the resistance of digital ICs to electromagnetic radiation, whose parameters are varied in a rather large range (at the wavelength λ= 4 cm, RF pulse duration τ = 0.1−1000 μs and pulse-repetition frequency F = 0.1−10000 Hz), are presented. The damage t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of communications technology & electronics 2011-03, Vol.56 (3), p.342-346
Hauptverfasser: Klyuchnik, A. V., Pirogov, Yu. A., Solodov, A. V.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The results of the experimental investigation of the resistance of digital ICs to electromagnetic radiation, whose parameters are varied in a rather large range (at the wavelength λ= 4 cm, RF pulse duration τ = 0.1−1000 μs and pulse-repetition frequency F = 0.1−10000 Hz), are presented. The damage to the ICs caused by the radiations is analyzed. The experiment conditions are compared to the actual irradiation conditions for the ICs mounted on an electronic-equipment printed circuit board.
ISSN:1064-2269
1555-6557
DOI:10.1134/S1064226911030041