High-Reliable and High-Speed 1.3 [mu]m Complex-Coupled Distributed Feedback Buried-Heterostructure Laser Diodes With Fe-Doped InGaAsP/InP Hybrid Grating Layers Grown by MOCVD
In this paper, we report the fabrication of high-reliability and high- speed 1.3 mum complex-coupled distributed feedback (CC-DFB) buried heterostructure (BH) laser diodes (LDs) with Fe-doped InGaAsP/InP hybrid grating layers. High optical coupling coefficient and eminent current confining ability a...
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Veröffentlicht in: | IEEE transactions on electron devices 2008-02, Vol.55 (2), p.540-546 |
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Sprache: | eng |
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Zusammenfassung: | In this paper, we report the fabrication of high-reliability and high- speed 1.3 mum complex-coupled distributed feedback (CC-DFB) buried heterostructure (BH) laser diodes (LDs) with Fe-doped InGaAsP/InP hybrid grating layers. High optical coupling coefficient and eminent current confining ability are accomplished by combining the Fe-doped InGaAsP/InP current-blocking-grating (CBG) layers to provide both the distributed- feedback index-and gain-coupling coefficients. Besides, the narrow-stripe BH LDs are implemented by burying the active region with a Fe-doped InP current- blocking layer during the epitaxial regrowth. The fabricated CBG CC-DFB BH LDs at 20degC shows a low threshold current of 5.3 mA, a maximum light output power of 36 mW at 100 mA, a high slope efficiency of 0.41 mW/mA, and a side- mode suppression ratio (SMSR) of 42 dB at twice the threshold. In addition, these LDs exhibit a maximum operation temperature of 125degC, an extremely low threshold current of 15.8 mA at 90degC, a small variation in slope efficient of only -1 dB in the temperature range from 20degC to 80degC, and a characteristic temperature of 77 K and 56 K between 20 degC and 60degC, and 70degC and 120degC, respectively. Furthermore, these 1.3 mum CBG CC-DFB BH LDs exhibit a high-speed characteristic up to 11.8 GHz at room temperature and an estimated median lifetime of more than 1.1 times 10@@u5@ h or 12.5 years at 5 mW and 85degC. |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/TED.2007.912948 |