Magnetic studies on ZnTe:Cr film grown on glass substrate by thermal evaporation method

ZnTe and ZnTe:Cr films were prepared on glass substrate by using thermal evaporation method. X-ray diffraction analysis revealed the presence of ZnCrTe phase. X-ray photoelectron spectroscopy was used to estimate the composition of as-prepared films. The valence state of Cr in ZnTe:Cr film is determ...

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Veröffentlicht in:	Applied surface science 2009-06, Vol.255 (17), p.7517-7523
Hauptverfasser:	Soundararajan, D., Mangalaraj, D., Nataraj, D., Dorosinskii, L., Santoyo-Salazar, J., Jeon, H.C., Kang, T.W.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Dilute magnetic semiconductors Exact sciences and technology Magnetic domains M– H curve Physics ZnTe:Cr film
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Beschreibung
Zusammenfassung:	ZnTe and ZnTe:Cr films were prepared on glass substrate by using thermal evaporation method. X-ray diffraction analysis revealed the presence of ZnCrTe phase. X-ray photoelectron spectroscopy was used to estimate the composition of as-prepared films. The valence state of Cr in ZnTe:Cr film is determined to be +2 by using electron spin resonance spectroscopy. Magnetic moment data as a function of magnetic field was recorded by using superconducting quantum interference device magnetometry at 300 K. The result showed a clear hysteresis loop with coercive field of 48 Oe. Magnetic domains were observed by using magnetic force microscopy and the average value of domain size was 3.7 nm.
ISSN:	0169-4332 1873-5584
DOI:	10.1016/j.apsusc.2009.04.012