Determination of the stress level for voltage screen of integrated circuits
Voltage screen is a method to screen out products that suffer from defectivity related issues. A risk associated with voltage screen is that the applied voltage is too severe and damages the product. Most papers dealing with voltage screen determine the stress voltage by a general rule of thumb (foc...
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| Veröffentlicht in: | Microelectronics and reliability 2010-09, Vol.50 (9), p.1210-1214 |
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| container_issue | 9 |
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| container_title | Microelectronics and reliability |
| container_volume | 50 |
| creator | Kho, R.M. Moonen, A.J. Girault, V.M. Bisschop, J. Olthof, E.H.T. Nath, S. Liang, Z.N. |
| description | Voltage screen is a method to screen out products that suffer from defectivity related issues. A risk associated with voltage screen is that the applied voltage is too severe and damages the product. Most papers dealing with voltage screen determine the stress voltage by a general rule of thumb (focusing on one specific mechanism) without taking into account the particularities and the knowledge of the specific process.
This paper describes a general approach to determine a safe level for voltage screening of products. In this approach, the onset of the wearout phase is not allowed to shift more than 1%. All the information needed to determine the voltage value is in general typically available from the process reliability tests performed as part of the process qualification. |
| doi_str_mv | 10.1016/j.microrel.2010.07.103 |
| format | Article |
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This paper describes a general approach to determine a safe level for voltage screening of products. In this approach, the onset of the wearout phase is not allowed to shift more than 1%. All the information needed to determine the voltage value is in general typically available from the process reliability tests performed as part of the process qualification.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/j.microrel.2010.07.103</identifier><identifier>CODEN: MCRLAS</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Applied sciences ; Dealing ; Design. Technologies. Operation analysis. Testing ; Electric potential ; Electronics ; Exact sciences and technology ; Focusing ; Integrated circuits ; Microelectronics ; Screening ; Screens ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Stresses ; Voltage</subject><ispartof>Microelectronics and reliability, 2010-09, Vol.50 (9), p.1210-1214</ispartof><rights>2010 Elsevier Ltd</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c374t-6ae16378fe473413e3c5ae78f42345f6b92d4042a054562e3464bca560bfb9213</citedby><cites>FETCH-LOGICAL-c374t-6ae16378fe473413e3c5ae78f42345f6b92d4042a054562e3464bca560bfb9213</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.microrel.2010.07.103$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,3550,23930,23931,25140,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23306900$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kho, R.M.</creatorcontrib><creatorcontrib>Moonen, A.J.</creatorcontrib><creatorcontrib>Girault, V.M.</creatorcontrib><creatorcontrib>Bisschop, J.</creatorcontrib><creatorcontrib>Olthof, E.H.T.</creatorcontrib><creatorcontrib>Nath, S.</creatorcontrib><creatorcontrib>Liang, Z.N.</creatorcontrib><title>Determination of the stress level for voltage screen of integrated circuits</title><title>Microelectronics and reliability</title><description>Voltage screen is a method to screen out products that suffer from defectivity related issues. A risk associated with voltage screen is that the applied voltage is too severe and damages the product. Most papers dealing with voltage screen determine the stress voltage by a general rule of thumb (focusing on one specific mechanism) without taking into account the particularities and the knowledge of the specific process.
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This paper describes a general approach to determine a safe level for voltage screening of products. In this approach, the onset of the wearout phase is not allowed to shift more than 1%. All the information needed to determine the voltage value is in general typically available from the process reliability tests performed as part of the process qualification.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.microrel.2010.07.103</doi><tpages>5</tpages></addata></record> |
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| ispartof | Microelectronics and reliability, 2010-09, Vol.50 (9), p.1210-1214 |
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| language | eng |
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| source | Access via ScienceDirect (Elsevier) |
| subjects | Applied sciences Dealing Design. Technologies. Operation analysis. Testing Electric potential Electronics Exact sciences and technology Focusing Integrated circuits Microelectronics Screening Screens Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Stresses Voltage |
| title | Determination of the stress level for voltage screen of integrated circuits |
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