Determination of the stress level for voltage screen of integrated circuits
Voltage screen is a method to screen out products that suffer from defectivity related issues. A risk associated with voltage screen is that the applied voltage is too severe and damages the product. Most papers dealing with voltage screen determine the stress voltage by a general rule of thumb (foc...
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Veröffentlicht in: | Microelectronics and reliability 2010-09, Vol.50 (9), p.1210-1214 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Voltage screen is a method to screen out products that suffer from defectivity related issues. A risk associated with voltage screen is that the applied voltage is too severe and damages the product. Most papers dealing with voltage screen determine the stress voltage by a general rule of thumb (focusing on one specific mechanism) without taking into account the particularities and the knowledge of the specific process.
This paper describes a general approach to determine a safe level for voltage screening of products. In this approach, the onset of the wearout phase is not allowed to shift more than 1%. All the information needed to determine the voltage value is in general typically available from the process reliability tests performed as part of the process qualification. |
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ISSN: | 0026-2714 1872-941X |
DOI: | 10.1016/j.microrel.2010.07.103 |