Determination of the stress level for voltage screen of integrated circuits

Voltage screen is a method to screen out products that suffer from defectivity related issues. A risk associated with voltage screen is that the applied voltage is too severe and damages the product. Most papers dealing with voltage screen determine the stress voltage by a general rule of thumb (foc...

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Veröffentlicht in:Microelectronics and reliability 2010-09, Vol.50 (9), p.1210-1214
Hauptverfasser: Kho, R.M., Moonen, A.J., Girault, V.M., Bisschop, J., Olthof, E.H.T., Nath, S., Liang, Z.N.
Format: Artikel
Sprache:eng
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Zusammenfassung:Voltage screen is a method to screen out products that suffer from defectivity related issues. A risk associated with voltage screen is that the applied voltage is too severe and damages the product. Most papers dealing with voltage screen determine the stress voltage by a general rule of thumb (focusing on one specific mechanism) without taking into account the particularities and the knowledge of the specific process. This paper describes a general approach to determine a safe level for voltage screening of products. In this approach, the onset of the wearout phase is not allowed to shift more than 1%. All the information needed to determine the voltage value is in general typically available from the process reliability tests performed as part of the process qualification.
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2010.07.103