Development of bottom-emitting 1300-nm vertical-cavity surface-emitting lasers

We present experimental results on the development of bottom-emitting GaInNAs vertical-cavity surface-emitting lasers (VCSELs) operating at wavelengths near 1300 nm. This development effort is based on the modification of oxide-apertured top-emitting structures to allow emission through the GaAs sub...

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Veröffentlicht in:IEEE photonics technology letters 2004-04, Vol.16 (4), p.963-965
Hauptverfasser: Louderback, D.A., Fish, M.A., Klem, J.F., Serkland, D.K., Choquette, K.D., Pickrell, G.W., Stone, R.V., Guilfoyle, P.S.
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Sprache:eng
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Zusammenfassung:We present experimental results on the development of bottom-emitting GaInNAs vertical-cavity surface-emitting lasers (VCSELs) operating at wavelengths near 1300 nm. This development effort is based on the modification of oxide-apertured top-emitting structures to allow emission through the GaAs substrate. Similar device performance was seen in both the top- and bottom-emitting structures. Single-mode output powers (adjusted for substrate absorption) of /spl sim/0.75 mW, with threshold currents of 1.3 mA, were achieved with /spl sim/3.5-μm aperture diameters. Larger multimode devices exhibited a maximum adjusted output power of 2.2 mW. To the best of our knowledge, these are the first bottom-emitting flip-chip compatible 1300-nm VCSELs fabricated with GaInNAs-GaAs active regions.
ISSN:1041-1135
1941-0174
DOI:10.1109/LPT.2004.824614