The Van der Pauw method for sheet resistance measurements of polypyrrole-coated para-aramide woven fabrics

The Van der Pauw method for sheet resistance measurements of polypyrrole-coated para-aramide woven fabrics

In this article, it is shown that the Van der Pauw (VDP) method, generally known in microelectronics, can be successfully adapted to sheet resistance measurements of electroconductive fabrics. We prepared two polypyrrole‐coated woven para‐aramide fabrics and used a simple setup to measure their shee...

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Veröffentlicht in:Journal of applied polymer science 2010-09, Vol.117 (5), p.2553-2558
Hauptverfasser: Banaszczyk, J., Schwarz, A., De Mey, G., Van Langenhove, L.
Format: Artikel
Sprache:eng
Schlagworte:
aging
Applied sciences
Arrays
Coating
coatings
conducting polymers
Contact
Electrical resistivity
Exact sciences and technology
Fabrics
Fibers and threads
Forms of application and semi-finished materials
Intervals
Microelectronics
Polymer industry, paints, wood
polypyrroles
Reproduction
Technology of polymers
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Beschreibung
Zusammenfassung:In this article, it is shown that the Van der Pauw (VDP) method, generally known in microelectronics, can be successfully adapted to sheet resistance measurements of electroconductive fabrics. We prepared two polypyrrole‐coated woven para‐aramide fabrics and used a simple setup to measure their sheet resistances. The results were then compared with those obtained using a sophisticated commercial collinear array probe. The measurements were done in a 1 month interval, to investigate the influence of the coating aging on the sheet resistance of the samples. The influence of the contact positioning on the accuracy of the VDP measurement was investigated. © 2010 Wiley Periodicals, Inc. J Appl Polym Sci, 2010
ISSN:0021-8995
1097-4628
1097-4628
DOI:10.1002/app.32186