Planar waveguide echelle gratings in silica-on-silicon

Silica planar waveguide echelle grating demultiplexers with 48 channels and 256 channels are described and demonstrated. Polarization effects due to stress birefringence and polarization-dependent grating efficiency have been eliminated using a modified polarization compensator and grating design. T...

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Veröffentlicht in:IEEE photonics technology letters 2004-02, Vol.16 (2), p.503-505
Hauptverfasser: Janz, S., Balakrishnan, A., Charbonneau, S., Cheben, P., Cloutier, M., Delage, A., Dossou, K., Erickson, L., Gao, M., Krug, P.A., Lamontagne, B., Packirisamy, M., Pearson, M., Xu, D.-X.
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Sprache:eng
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Zusammenfassung:Silica planar waveguide echelle grating demultiplexers with 48 channels and 256 channels are described and demonstrated. Polarization effects due to stress birefringence and polarization-dependent grating efficiency have been eliminated using a modified polarization compensator and grating design. The devices have a polarization-dependent wavelength shift of less than 10 pm, and a polarization-dependent loss below 0.2 dB. The 48-channel device has a measured crosstalk of -35 dB, an insertion loss better than 4 dB, and a uniformity of 1 dB across the C-band.
ISSN:1041-1135
1941-0174
DOI:10.1109/LPT.2003.823139