Automatic Identification of Impairments Using Support Vector Machine Pattern Classification on Eye Diagrams

Automatic Identification of Impairments Using Support Vector Machine Pattern Classification on Eye Diagrams

We have demonstrated powerful new techniques for identifying the optical impairments causing the degradation of an optical channel. We use machine learning and pattern classification techniques on eye diagrams to identify the optical impairments. These capabilities can enable the development of low-...

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Veröffentlicht in:IEEE photonics technology letters 2006-11, Vol.18 (22), p.2398-2400
Hauptverfasser: Skoog, R.A., Banwell, T.C., Gannett, J.W., Habiby, S.F., Pang, M., Rauch, M.E., Toliver, P.
Format: Artikel
Sprache:eng
Schlagworte:
Channels
Classification
Degradation
Diagnostic systems
Impairment
Machine learning
Monitoring
Monitors
Optical character recognition software
Optical computing
optical performance monitoring (OPM)
Pattern classification
pattern recognition
Photonics
Signal analysis
Signal processing
Support vector machine classification
Support vector machines
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Beschreibung
Zusammenfassung:We have demonstrated powerful new techniques for identifying the optical impairments causing the degradation of an optical channel. We use machine learning and pattern classification techniques on eye diagrams to identify the optical impairments. These capabilities can enable the development of low-cost optical performance monitors having significant diagnostic capabilities
ISSN:1041-1135
1941-0174
DOI:10.1109/LPT.2006.886146