Dynamics of a Disturbed Sessile Drop Measured by Atomic Force Microscopy (AFM)

Dynamics of a Disturbed Sessile Drop Measured by Atomic Force Microscopy (AFM)

A new method for studying the dynamics of a sessile drop by atomic force microscopy (AFM) is demonstrated. A hydrophobic microsphere (radius, r ∼ 20–30 μm) is brought into contact with a small sessile water drop resting on a polytetrafluoroethylene (PTFE) surface. When the microsphere touches the li...

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Veröffentlicht in:Langmuir 2011-10, Vol.27 (19), p.11966-11972
Hauptverfasser: McGuiggan, Patricia M, Grave, Daniel A, Wallace, Jay S, Cheng, Shengfeng, Prosperetti, Andrea, Robbins, Mark O
Format: Artikel
Sprache:eng
Schlagworte:
Chemistry
Exact sciences and technology
General and physical chemistry
Hydrophobic and Hydrophilic Interactions
Interfaces: Adsorption, Reactions, Films, Forces
Microscopy, Atomic Force - methods
Particle Size
Polytetrafluoroethylene - chemistry
Surface physical chemistry
Surface Properties
Thermodynamics
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Zusammenfassung:A new method for studying the dynamics of a sessile drop by atomic force microscopy (AFM) is demonstrated. A hydrophobic microsphere (radius, r ∼ 20–30 μm) is brought into contact with a small sessile water drop resting on a polytetrafluoroethylene (PTFE) surface. When the microsphere touches the liquid surface, the meniscus rises onto it because of capillary forces. Although the microsphere volume is 6 orders of magnitude smaller than the drop, it excites the normal resonance modes of the liquid interface. The sphere is pinned at the interface, whose small (
ISSN:0743-7463
1520-5827
DOI:10.1021/la2023709