Impact of Switched Dose-Rate Irradiation on the Response of the LM124 Operational Amplifier to Pulsed X-Rays

The Synergistic effect between TID and ATREEs (Analog Transient Radiation Effects on Electronics) in an operational amplifier (opamp) (LM124) is investigated for three different bias configurations. An accelerated irradiation technique is used to study these synergistic effects. The impact of TID on...

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Veröffentlicht in:	IEEE transactions on nuclear science 2011-06, Vol.58 (3), p.960-968
Hauptverfasser:	Roche, N J.-H, Dusseau, L, Mekki, J, Perez, S, Vaille, J.-R, Gonzalez Velo, Yago, Boch, J, Saigne, F, Marec, R, Calvel, P, Bezerra, F, Auriel, G, Azais, B, Buchner, S P
Format:	Artikel
Sprache:	eng
Schlagworte:	Analog circuits bipolar circuits Degradation Deviation Dosage Electronics Engineering Sciences integrated circuit radiation effects Inverters ionizing dose Irradiation Operational amplifiers Radiation effects Shape single event transients Switches Switching Synergistic effect total dose effects Transient analysis transient radiation effects transient response x-ray effects X-rays
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Beschreibung
Zusammenfassung:	The Synergistic effect between TID and ATREEs (Analog Transient Radiation Effects on Electronics) in an operational amplifier (opamp) (LM124) is investigated for three different bias configurations. An accelerated irradiation technique is used to study these synergistic effects. The impact of TID on ATREEs is found to be identical regardless of whether the irradiation is performed at low dose rate or whether the dose rate is switched from high to low using the Dose Rate Switching (DRS) technique. The correlation between the deviations of the opamp's electrical parameters and the changes of ATREE widths is clearly established.
ISSN:	0018-9499 1558-1578
DOI:	10.1109/TNS.2011.2136360