Bipolar switching characteristics of low-power Geo resistive memory

► We demonstrate GeO x RRAM with both cost-effective and ultra-low power. ► Hopping conduction mechanism effectively lowers switched currents. ► Self-compliance switched mode presents from penalties of excess forming current via filaments. ► Size-related switched power enables application of high-de...

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Veröffentlicht in:Solid-state electronics 2011-08, Vol.62 (1), p.90-93
Hauptverfasser: Cheng, C.H., Chen, P.C., Liu, S.L., Wu, T.L., Hsu, H.H., Chin, Albert, Yeh, F.S.
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Sprache:eng
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Zusammenfassung:► We demonstrate GeO x RRAM with both cost-effective and ultra-low power. ► Hopping conduction mechanism effectively lowers switched currents. ► Self-compliance switched mode presents from penalties of excess forming current via filaments. ► Size-related switched power enables application of high-density memory. We reported an ultra low-power resistive random access memory (RRAM) combining a low-cost Ni electrode and covalent-bond GeO x dielectric. This cost-effective Ni/GeO x /TaN RRAM device has very small set power of 2 μW, ultra-low reset power of 130 pW, greater than 1 order of magnitude resistance window, and stable retention at 85 °C. The current flow at low-resistance state is governed by Poole–Frenkel conduction with electrons hopping via defect traps, which is quite different from the filament conduction in metal-oxide RRAM.
ISSN:0038-1101
1879-2405
DOI:10.1016/j.sse.2011.04.010