Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (

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Bibliographische Detailangaben
Veröffentlicht in:	Ultramicroscopy 2011-07, Vol.111 (8), p.999-1013
Hauptverfasser:	Lugg, N.R., Findlay, S.D., Shibata, N., Mizoguchi, T., D’Alfonso, A.J., Allen, L.J., Ikuhara, Y.
Format:	Artikel
Sprache:	eng
Schlagworte:	Annular bright field (ABF) Beams (radiation) Complement Dynamics Electric potential Electron energy-loss spectroscopy (EELS) High-angle annular dark field (HAADF) Imaging Low accelerating voltages Scanning electron microscopy Scanning transmission electron microscopy Scanning transmission electron microscopy (STEM) Voltage
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Beschreibung
Zusammenfassung:	Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (
ISSN:	0304-3991 1879-2723
DOI:	10.1016/j.ultramic.2011.02.009