Ultrafast Imaging and the Phase Problem for Inelastic X-Ray Scattering

A new method for imaging ultrafast dynamics in condensed matter using inelastic X‐ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or “phase problem”) for IXS is illustrated, which enables direct imaging of d...

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Veröffentlicht in:	Advanced materials (Weinheim) 2010-03, Vol.22 (10), p.1141-1147
Hauptverfasser:	Abbamonte, Peter, Wong, Gerard C. L., Cahill, David G., Reed, James P., Coridan, Robert H., Schmidt, Nathan W., Lai, Ghee Hwee, Joe, Young Il, Casa, Diego
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Condensed matter Dynamics Elasticity Electron density Electrons Fourier Analysis Fourier transformation Imaging Inelastic scattering Inelastic X-Ray Scattering Neutron scattering Neutrons Phase Problem Scattering, Radiation Ultrafast imaging X-Rays
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Beschreibung
Zusammenfassung:	A new method for imaging ultrafast dynamics in condensed matter using inelastic X‐ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or “phase problem”) for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of ∼1 attosecond (10−18 s) in time and
ISSN:	0935-9648 1521-4095 1521-4095
DOI:	10.1002/adma.200904098