Testing Ternary Content Addressable Memories With Comparison Faults Using March-Like Tests

Testing Ternary Content Addressable Memories With Comparison Faults Using March-Like Tests

Compared with the previous work, the proposed tests have lower time complexity for typical TCAMs; they can be used to test TCAMs with different comparator structures; and their time complexities are independent of the number of stuck-on faults.

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on computer-aided design of integrated circuits and systems 2007-05, Vol.26 (5), p.919-931
1. Verfasser: Li, Jin-Fu
Format: Artikel
Sprache:eng
Schlagworte:
Circuits
Complexity
Content addressable
Delay
Design engineering
Encoders
Faults
Mathematical models
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Beschreibung
Zusammenfassung:Compared with the previous work, the proposed tests have lower time complexity for typical TCAMs; they can be used to test TCAMs with different comparator structures; and their time complexities are independent of the number of stuck-on faults.
ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2006.884415