Universal Method for Extracting Transport Parameters From Monte Carlo Device Simulation

The extraction of transport parameters as mobilities and diffusivities has been a subject of research for more than 20 years. However, the solutions proposed up to now are not satisfactory particularly when applied to nanoscale devices. In this brief, we review the two most popular methods to extrac...

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Veröffentlicht in:IEEE transactions on electron devices 2007-11, Vol.54 (11), p.3092-3096
Hauptverfasser: Brugger, S.C., Schenk, A.
Format: Artikel
Sprache:eng
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Zusammenfassung:The extraction of transport parameters as mobilities and diffusivities has been a subject of research for more than 20 years. However, the solutions proposed up to now are not satisfactory particularly when applied to nanoscale devices. In this brief, we review the two most popular methods to extract mobilities and show how they fail in nanoscale devices, where transport is strongly quasi-ballistic. We also show that these methods are not appropriate to extract tensorial transport parameters. As an alternative, we propose to use recently derived general definitions of mobilities and diffusivities that naturally solve these problems and, thus, constitute a universal method to extract transport parameters.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2007.906937