Experimental determination of C sub(m measurement related hardware parameters of the patch-clamp amplifier)
Accurate C sub(m measurements rely on accurate determination of specific parameters of a patch-clamp amplifier (PCA). Hardware-related parameters, such as the resistance R) sub(f) and the stray capacitance C sub(f of the feedback resistor, the input capacitance C) sub(i), the injection capacitance C...
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Veröffentlicht in: | Journal of neuroscience methods 2009-01, Vol.176 (2), p.246-253 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Accurate C sub(m measurements rely on accurate determination of specific parameters of a patch-clamp amplifier (PCA). Hardware-related parameters, such as the resistance R) sub(f) and the stray capacitance C sub(f of the feedback resistor, the input capacitance C) sub(i), the injection capacitance C sub(j, and the extra capacitances introduced by the BNC connector, are of significance in the sense of obtaining absolute estimates of cell parameters. In the present paper, a frequency-domain method, or the f-method for simplicity, is put forward to experimentally determine the actual values of basic circuit elements for our self-developed PCA. The f-method makes use of sine waves and amplitude/phase measurements instead of the square-wave responses to determine the above parameters of a PCA, and thereby calibrates the PAC for capacitance measurements. Experimental results prove that the f-method is excellent in determining hardware-related parameters, with 3-5% error of the impedance of the "10 M[Omega] setting", and about 2% error of the impedance of the "model cell" of the model circuit for our PCA. The f-method enables us not only to picture components of fast capacitances, but also to guarantee complete fast capacitance compensation; it may be applicable for other PCAs.) |
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ISSN: | 0165-0270 |
DOI: | 10.1016/j.jneumeth.2008.08.022 |