Nanoscale Structure and Mechanism for Enhanced Electromechanical Response of Highly Strained BiFeO3 Thin Films

The presence of a variety of structural variants in BiFeO3 thin films give rise to exotic electric‐field‐induced responses and resulting electromechanical responses as large as 5%. Using high‐resolution X‐ray diffraction and scanning‐probe‐micro­scopy‐based studies the numerous phases present at the...

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Veröffentlicht in:Advanced materials (Weinheim) 2011-07, Vol.23 (28), p.3170-3175
Hauptverfasser: Damodaran, Anoop R., Liang, Chen-Wei, He, Qing, Peng, Chun-Yen, Chang, Li, Chu, Ying-Hao, Martin, Lane W.
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Sprache:eng
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Zusammenfassung:The presence of a variety of structural variants in BiFeO3 thin films give rise to exotic electric‐field‐induced responses and resulting electromechanical responses as large as 5%. Using high‐resolution X‐ray diffraction and scanning‐probe‐micro­scopy‐based studies the numerous phases present at the phase boundaries are identified and an intermediate monoclinic phase, in addition to the previously observed rhombohedral‐ and tetragonal‐like phases, is discovered.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.201101164