All-Optical Format Conversion of NRZ-OOK to RZ-OOK in a Silicon Nanowire Utilizing Either XPM or FWM and Resulting in a Receiver Sensitivity Gain of similar to 2.5 dB

All-optical format conversion of 10 Gb/s non-return-to-zero on-off keying (NRZ-OOK) to RZ-OOK has been successfully achieved, for the first time to our knowledge, utilizing either cross-phase modulation (XPM) or four-wave mixing (FWM), in a Silicon (Si) nanowire. A 10 - 9 -bit-error-rate (BER) recei...

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Veröffentlicht in:IEEE journal of selected topics in quantum electronics 2010-01, Vol.16 (1), p.234-249
Hauptverfasser: Astar, W, Driscoll, Jeffrey B, Liu, Xiaoping, Dadap, Jerry I, Green, William MJ, Vlasov, Yurii A, Carter, Gary M, Osgood, Richard M
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Sprache:eng
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Zusammenfassung:All-optical format conversion of 10 Gb/s non-return-to-zero on-off keying (NRZ-OOK) to RZ-OOK has been successfully achieved, for the first time to our knowledge, utilizing either cross-phase modulation (XPM) or four-wave mixing (FWM), in a Silicon (Si) nanowire. A 10 - 9 -bit-error-rate (BER) receiver sensitivity gain of similar to 2.8 dB was obtained for converted RZ-OOK relative to NRZ-OOK using XPM, whereas a receiver sensitivity gain of similar to 2.5 dB was found for the FWM anti-Stokes RZ-OOK. Simultaneous wavelength and pulse format conversions were possible with FWM. No evidence of an error floor for BER < 10 - 10 was observed in either technique. The converted RZ-OOK signal was also correctly encoded and of the correct polarity.
ISSN:1077-260X
1558-4542
DOI:10.1109/JSTQE.2009.2029872