Rotatable broadband retarders for far-infrared spectroscopic ellipsometry

Rotatable broadband retarders for far-infrared spectroscopic ellipsometry

Rotatable retarders have been developed for applications in spectroscopic, full Mueller Matrix ellipsometry in the far-IR spectral range. Several materials, such as silicon, KRS-5, and a commercial polymer plastic (TOPAS) have been utilized to achieve a fully adjustable retardation between 0° and 90...

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Veröffentlicht in:Thin solid films 2011-02, Vol.519 (9), p.2698-2702
Hauptverfasser: Kang, T.D., Standard, E., Carr, G.L., Zhou, T., Kotelyanskii, M., Sirenko, A.A.
Format: Artikel
Sprache:eng
Schlagworte:
Broadband
Double-Fresnel rhomb
Ellipsometry
Exact sciences and technology
Far-infrared retarder
Focusing
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Mathematical analysis
Optical instruments, equipment and techniques
Physics
Polarimeters and ellipsometers
Retarders
Rotatable retarder
Spectra
Spectroscopic ellipsometry
Spectroscopy
Thin films
TOPAS
Total internal reflection
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Beschreibung
Zusammenfassung:Rotatable retarders have been developed for applications in spectroscopic, full Mueller Matrix ellipsometry in the far-IR spectral range. Several materials, such as silicon, KRS-5, and a commercial polymer plastic (TOPAS) have been utilized to achieve a fully adjustable retardation between 0° and 90°. Experimental characteristics of the rotatable retarders that utilize three- and four-bounce designs are compared with calculations. We discuss the effect of light focusing on the performance of these rotatable retarders.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2010.12.057