Optical, structural and electrochromic properties of nickel oxide films produced by sol–gel technique
Nickel oxide films have been deposited from nickel acetate precursor using a sol–gel dip coating method, onto glass and conducting fluorine doped tin oxide (FTO) glass substrate. The direct energy gap ( E gd) values for the 2–10 layered films are in the range of 3.62 eV–3.72 eV. X-ray diffraction (X...
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Veröffentlicht in: | Solar energy 2011-05, Vol.85 (5), p.978-984 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Nickel oxide films have been deposited from nickel acetate precursor using a sol–gel dip coating method, onto glass and conducting fluorine doped tin oxide (FTO) glass substrate. The direct energy gap (
E
gd) values for the 2–10 layered films are in the range of 3.62
eV–3.72
eV. X-ray diffraction (XRD) analysis reveals that films consisting of 2–6 layers are amorphous, while films consisting of 8–10 layers are poly-crystalline with cubic grains of around 12
nm–20
nm and preferential growth along the (1
1
1) and (2
0
0) planes. Fourier Transform Infrared (FTIR) spectrum confirms the formation of Ni–O. Electrochromic properties of the nickel oxide coatings were studied using cyclic voltammetric (CV) technique. The 8 layered NiO films exhibit the anodic/cathodic diffusion coefficient of 16.7/5.73
×
10
−13
cm
2/s and the change in optical transmission is Δ
T
630nm
=
53% with a photopic contrast ratio of 2.87. |
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ISSN: | 0038-092X 1471-1257 |
DOI: | 10.1016/j.solener.2011.02.012 |