Contact Doping and Ultrathin Gate Dielectrics for Nanoscale Organic Thin-Film Transistors

To suppress undesirable short‐channel effects in organic transistors with nanoscale lateral dimensions, aggressive gate‐dielectric scaling (using an ultra‐thin monolayer‐based gate dielectric) and area‐selective contact doping (using a strong organic dopant) are introduced into organic transistors w...

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Veröffentlicht in:Small (Weinheim an der Bergstrasse, Germany) Germany), 2011-05, Vol.7 (9), p.1186-1191
Hauptverfasser: Ante, Frederik, Kälblein, Daniel, Zschieschang, Ute, Canzler, Tobias W., Werner, Ansgar, Takimiya, Kazuo, Ikeda, Masaaki, Sekitani, Tsuyoshi, Someya, Takao, Klauk, Hagen
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container_end_page 1191
container_issue 9
container_start_page 1186
container_title Small (Weinheim an der Bergstrasse, Germany)
container_volume 7
creator Ante, Frederik
Kälblein, Daniel
Zschieschang, Ute
Canzler, Tobias W.
Werner, Ansgar
Takimiya, Kazuo
Ikeda, Masaaki
Sekitani, Tsuyoshi
Someya, Takao
Klauk, Hagen
description To suppress undesirable short‐channel effects in organic transistors with nanoscale lateral dimensions, aggressive gate‐dielectric scaling (using an ultra‐thin monolayer‐based gate dielectric) and area‐selective contact doping (using a strong organic dopant) are introduced into organic transistors with channel lengths and gate‐to‐contact overlaps of about 100 nm. These nanoscale organic transistors have off‐state drain currents below 1 pA, on/off current ratios near 107, and clean linear and saturation characteristics.
doi_str_mv 10.1002/smll.201002254
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subjects contact doping
contact resistance
Nanotechnology - methods
organic thin-film transistors
transfer length
Transistors, Electronic
ultra-thin gate dielectrics
title Contact Doping and Ultrathin Gate Dielectrics for Nanoscale Organic Thin-Film Transistors
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