Masking of X-Values by Use of a Hierarchically Configurable Register

Masking of X-Values by Use of a Hierarchically Configurable Register

In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [ 4 ], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-mas...

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Veröffentlicht in:Journal of electronic testing 2011-02, Vol.27 (1), p.31-41
Hauptverfasser: Rabenalt, Thomas, Goessel, Michael, Leininger, Andreas
Format: Artikel
Sprache:eng
Schlagworte:
CAE) and Design
Circuits
Circuits and Systems
Computer-Aided Engineering (CAD
Configurable
Electrical Engineering
Electronics
Engineering
Integrated circuits
Masking
Registers
Test methods
Very large scale integration
VLSI
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Beschreibung
Zusammenfassung:In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [ 4 ], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-masking can be significantly reduced in comparison to WIDE1. This is demonstrated for three industrial designs. In cases where all X-values have to be masked the novel approach is especially efficient.
ISSN:0923-8174
1573-0727
DOI:10.1007/s10836-010-5179-2