Development of higher performance indium tin oxide films at a very low temperature (< 80 °C) by the neutral beam-assisted sputtering process

At very low temperatures (< 80 °C), improved performance indium tin oxide (ITO) thin films with a low resistivity of 4.22 × 10 −4 Ωcm and high transmittance > 90% at 550 nm were developed using the neutral beam-assisted sputtering (NBAS) technique, which included a cyclic inter-treatment proce...

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Veröffentlicht in:Thin solid films 2011-01, Vol.519 (7), p.2098-2102
Hauptverfasser: Jang, Jin Nyoung, Lee, You Jong, Lee, Jun Young, Jang, Yun Sung, Hong, MunPyo, Oh, Kyoung Suk, Yoo, Suk Jae, Kim, Daechul, Lee, Bonju, Jang, Won-Gun
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Sprache:eng
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Zusammenfassung:At very low temperatures (< 80 °C), improved performance indium tin oxide (ITO) thin films with a low resistivity of 4.22 × 10 −4 Ωcm and high transmittance > 90% at 550 nm were developed using the neutral beam-assisted sputtering (NBAS) technique, which included a cyclic inter-treatment process with an Ar neutral beam. Transmission electron microscopy and electron diffraction showed that the neutral particles with hyper-thermal energy was able to enhance the formation of the nano-crystalline phase and activate the dopant without additional heating or plasma damage during ITO thin film deposition.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2010.10.041