Status of High-Index Materials for Generation-Three 193nm Immersion Lithography

Generation-three (Gen-3) immersion lithography can be an enabler for the 32nm half-pitch node. For Gen-3 lithography to be successful, however, there must be three major breakthroughs in materials development: high refractive index ("high-index") lenses, high-index immersion fluids, and hi...

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Veröffentlicht in:Journal of Photopolymer Science and Technology 2007, Vol.20(5), pp.643-650
Hauptverfasser: Zimmerman, Paul A., Peski, Chris van, Rice, Bryan, Byers, Jeff, Turro, Nicholas J., Lei, Xuegong, Gejo, Juan Lopez, Liberman, Vladmir, Palmacci, Steve, Rothchild, Mordy, Whitker, Andrew, Blakey, Idriss, Chen, Lan, Dargaville, Bronwin, Liu, Heping
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container_end_page 650
container_issue 5
container_start_page 643
container_title Journal of Photopolymer Science and Technology
container_volume 20
creator Zimmerman, Paul A.
Peski, Chris van
Rice, Bryan
Byers, Jeff
Turro, Nicholas J.
Lei, Xuegong
Gejo, Juan Lopez
Liberman, Vladmir
Palmacci, Steve
Rothchild, Mordy
Whitker, Andrew
Blakey, Idriss
Chen, Lan
Dargaville, Bronwin
Liu, Heping
description Generation-three (Gen-3) immersion lithography can be an enabler for the 32nm half-pitch node. For Gen-3 lithography to be successful, however, there must be three major breakthroughs in materials development: high refractive index ("high-index") lenses, high-index immersion fluids, and high-index photo-resists. Currently a material for a high-index lens element, lutetium aluminum garnet (LuAG), has been identified. However, suitable materials choices remain elusive for both the Gen-3 fluid and resist. This paper reviews the successes and failures in the search for Gen-3 high-index materials.
doi_str_mv 10.2494/photopolymer.20.643
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source Full-Text Journals in Chemistry (Open access); EZB Electronic Journals Library; J-STAGE
subjects fluid
Fluid dynamics
Fluid flow
Fluids
Garnets
Immersion
Immersion lithograph
lens
Lenses
Lithography
Materials selection
refractive index
resist
title Status of High-Index Materials for Generation-Three 193nm Immersion Lithography
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