Interlayer Exchange Coupling in Full Heusler hbox Co 2 hbox FeSi / Cr / Co 2 hbox FeSi Epitaxial Trilayer Structures

Interlayer exchange coupling was investigated in rm Co 2 rm FeSi ( 20 Unknown character rm nm ) / rm Cr ( t rm Cr = 0.6 Unknown character rm to Unknown character 3 Unknown character rm nm ) / rm Co 2 rm FeSi ( 7 Unknown character rm nm ) epitaxial trilayer structures by M - H loop measurement and using a numerical simulation method. The epitaxial growth and the presence of partial B 2 ordering in rm Co 2 rm FeSi films were confirmed from the XRD patterns. The bilinear coupling parameter J 1 and 90 [compfn] coupling parameter J 2 were determined from the numerical simulation of M - H loops for trilayers. The absence of 180 [compfn] coupling and the presence of dominating 90 [compfn] coupling were observed from the comparison between the numerical simulations and measured M - H loops within a wide range of spacer thickness. The strength of the 90 [compfn] coupling was found to vary with the spacer thickness and only a peak of J 2 was observed at t rm Cr = 1.2 Unknown character rm nm .