First Record of Single-Event Upset on Ground, Cray-1 Computer at Los Alamos in 1976

First Record of Single-Event Upset on Ground, Cray-1 Computer at Los Alamos in 1976

Records of bit flips in the Cray-1 computer installed at Los Alamos, NM, in 1976 lead to an upset rate in the Cray-1's bipolar SRAMs that correlates with the single-event upsets (SEUs) being induced by the atmospheric neutrons.

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on nuclear science 2010-12, Vol.57 (6), p.3114-3120
Hauptverfasser: Normand, E, Wert, J L, Quinn, H, Fairbanks, T D, Michalak, S, Grider, G, Iwanchuk, P, Morrison, J, Wender, S, Johnson, S
Format: Artikel
Sprache:eng
Schlagworte:
Atmospheric neutrons
Atmospherics
computer errors
Computer performance
Correlation
Grounds
neutron radiation effects
Neutrons
Radiation effects
Single event upset
single-event upset (SEU)
SRAM chip
SRAM chips
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Beschreibung
Zusammenfassung:Records of bit flips in the Cray-1 computer installed at Los Alamos, NM, in 1976 lead to an upset rate in the Cray-1's bipolar SRAMs that correlates with the single-event upsets (SEUs) being induced by the atmospheric neutrons.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2010.2083687