Transmission electron microscopy study of defects in AlN crystals with rough and smooth surface grains
Defects present in (0 0 0 1) textured polycrystalline AlN grown by the sublimation–recombination method were analyzed using transmission electron microscopy (TEM) methods. Grains in the polycrystalline boule had either a smooth or a rough surface. The rough surface grains had mainly edge dislocation...
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| Veröffentlicht in: | Journal of crystal growth 2010-11, Vol.312 (23), p.3479-3484 |
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| container_end_page | 3484 |
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| container_issue | 23 |
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| container_title | Journal of crystal growth |
| container_volume | 312 |
| creator | Nyakiti, L.O. Chaudhuri, J. Gu, Z. Edgar, J.H. |
| description | Defects present in (0
0
0
1) textured polycrystalline AlN grown by the sublimation–recombination method were analyzed using transmission electron microscopy (TEM) methods. Grains in the polycrystalline boule had either a smooth or a rough surface. The rough surface grains had mainly edge dislocations, whereas the smooth surface grains had some sub-grain boundaries and were mostly free of dislocations. Dislocations at the grain boundaries were pinned and could not be annihilated. |
| doi_str_mv | 10.1016/j.jcrysgro.2010.09.014 |
| format | Article |
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1) textured polycrystalline AlN grown by the sublimation–recombination method were analyzed using transmission electron microscopy (TEM) methods. Grains in the polycrystalline boule had either a smooth or a rough surface. The rough surface grains had mainly edge dislocations, whereas the smooth surface grains had some sub-grain boundaries and were mostly free of dislocations. Dislocations at the grain boundaries were pinned and could not be annihilated.</description><identifier>ISSN: 0022-0248</identifier><identifier>EISSN: 1873-5002</identifier><identifier>DOI: 10.1016/j.jcrysgro.2010.09.014</identifier><identifier>CODEN: JCRGAE</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>A1. Dislocations ; A1. Grain boundaries ; A1. Polarity ; A1. Transmission electron microscopy ; A3. Sublimation–recombination crystal growth ; Aluminum nitride ; B1. Aluminum nitride ; Boundaries ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Crystal defects ; Crystal growth ; Defects and impurities in crystals; microstructure ; Dislocations ; Electron microscopy ; Exact sciences and technology ; Grain and twin boundaries ; Grain boundaries ; Grains ; Growth from vapor ; Materials science ; Methods of crystal growth; physics of crystal growth ; Physics ; Structure of solids and liquids; crystallography</subject><ispartof>Journal of crystal growth, 2010-11, Vol.312 (23), p.3479-3484</ispartof><rights>2010 Elsevier B.V.</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c374t-36c6319ad172c2be1b61ef7ea01d2a42bcbe72c0688b345e0fae5bff3f1b5fde3</citedby><cites>FETCH-LOGICAL-c374t-36c6319ad172c2be1b61ef7ea01d2a42bcbe72c0688b345e0fae5bff3f1b5fde3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.jcrysgro.2010.09.014$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23403618$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Nyakiti, L.O.</creatorcontrib><creatorcontrib>Chaudhuri, J.</creatorcontrib><creatorcontrib>Gu, Z.</creatorcontrib><creatorcontrib>Edgar, J.H.</creatorcontrib><title>Transmission electron microscopy study of defects in AlN crystals with rough and smooth surface grains</title><title>Journal of crystal growth</title><description>Defects present in (0
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1) textured polycrystalline AlN grown by the sublimation–recombination method were analyzed using transmission electron microscopy (TEM) methods. Grains in the polycrystalline boule had either a smooth or a rough surface. The rough surface grains had mainly edge dislocations, whereas the smooth surface grains had some sub-grain boundaries and were mostly free of dislocations. Dislocations at the grain boundaries were pinned and could not be annihilated.</description><subject>A1. Dislocations</subject><subject>A1. Grain boundaries</subject><subject>A1. Polarity</subject><subject>A1. Transmission electron microscopy</subject><subject>A3. Sublimation–recombination crystal growth</subject><subject>Aluminum nitride</subject><subject>B1. 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Dislocations</topic><topic>A1. Grain boundaries</topic><topic>A1. Polarity</topic><topic>A1. Transmission electron microscopy</topic><topic>A3. Sublimation–recombination crystal growth</topic><topic>Aluminum nitride</topic><topic>B1. 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| subjects | A1. Dislocations A1. Grain boundaries A1. Polarity A1. Transmission electron microscopy A3. Sublimation–recombination crystal growth Aluminum nitride B1. Aluminum nitride Boundaries Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Crystal defects Crystal growth Defects and impurities in crystals microstructure Dislocations Electron microscopy Exact sciences and technology Grain and twin boundaries Grain boundaries Grains Growth from vapor Materials science Methods of crystal growth physics of crystal growth Physics Structure of solids and liquids crystallography |
| title | Transmission electron microscopy study of defects in AlN crystals with rough and smooth surface grains |
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