Transmission electron microscopy study of defects in AlN crystals with rough and smooth surface grains
Defects present in (0 0 0 1) textured polycrystalline AlN grown by the sublimation–recombination method were analyzed using transmission electron microscopy (TEM) methods. Grains in the polycrystalline boule had either a smooth or a rough surface. The rough surface grains had mainly edge dislocation...
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Veröffentlicht in: | Journal of crystal growth 2010-11, Vol.312 (23), p.3479-3484 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Defects present in (0
0
0
1) textured polycrystalline AlN grown by the sublimation–recombination method were analyzed using transmission electron microscopy (TEM) methods. Grains in the polycrystalline boule had either a smooth or a rough surface. The rough surface grains had mainly edge dislocations, whereas the smooth surface grains had some sub-grain boundaries and were mostly free of dislocations. Dislocations at the grain boundaries were pinned and could not be annihilated. |
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ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/j.jcrysgro.2010.09.014 |