Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics
The high transparency of carbon-containing materials in the spectral region of “carbon window” ( λ ∼ 4.5–5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5 nm has sti...
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Veröffentlicht in: | Micron (Oxford, England : 1993) England : 1993), 2010-10, Vol.41 (7), p.722-728 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The high transparency of carbon-containing materials in the spectral region of “carbon window” (
λ
∼
4.5–5
nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5
nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of
Nd–glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets. |
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ISSN: | 0968-4328 1878-4291 |
DOI: | 10.1016/j.micron.2010.06.011 |