Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics

The high transparency of carbon-containing materials in the spectral region of “carbon window” ( λ ∼ 4.5–5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5 nm has sti...

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Veröffentlicht in:Micron (Oxford, England : 1993) England : 1993), 2010-10, Vol.41 (7), p.722-728
Hauptverfasser: Artyukov, I.A., Feschenko, R.M., Vinogradov, A.V., Bugayev, Ye.A., Devizenko, O.Y., Kondratenko, V.V., Kasyanov, Yu.S., Hatano, T., Yamamoto, M., Saveliev, S.V.
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Sprache:eng
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Zusammenfassung:The high transparency of carbon-containing materials in the spectral region of “carbon window” ( λ ∼ 4.5–5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5 nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd–glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets.
ISSN:0968-4328
1878-4291
DOI:10.1016/j.micron.2010.06.011