Growth and structure of crystalline silica sheet on Ru(0001)

Growth and structure of crystalline silica sheet on Ru(0001)

Thin SiO₂ films were grown on a Ru(0001) single crystal and studied by photoelectron spectroscopy, infrared spectroscopy and scanning probe microscopy. The experimental results in combination with density functional theory calculations provide compelling evidence for the formation of crystalline, do...

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Veröffentlicht in:Physical review letters 2010-09, Vol.105 (14), p.146104-146104, Article 146104
Hauptverfasser: Löffler, D, Uhlrich, J J, Baron, M, Yang, B, Yu, X, Lichtenstein, L, Heinke, L, Büchner, C, Heyde, M, Shaikhutdinov, S, Freund, H-J, Włodarczyk, R, Sierka, M, Sauer, J
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Sprache:eng
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Zusammenfassung:Thin SiO₂ films were grown on a Ru(0001) single crystal and studied by photoelectron spectroscopy, infrared spectroscopy and scanning probe microscopy. The experimental results in combination with density functional theory calculations provide compelling evidence for the formation of crystalline, double-layer sheet silica weakly bound to a metal substrate.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.105.146104