A primary standard equipment for measuring roughness parameters in the range from nanometers to millimeters
Descriptions are given of a primary-standard interference equipment and a computer program for measuring roughness parameters ranging from nanometers to millimeters.[PUBLICATION ABSTRACT]
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Veröffentlicht in: | Measurement techniques 2007-11, Vol.50 (11), p.1143-1148 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Descriptions are given of a primary-standard interference equipment and a computer program for measuring roughness parameters ranging from nanometers to millimeters.[PUBLICATION ABSTRACT] |
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ISSN: | 0543-1972 1573-8906 |
DOI: | 10.1007/s11018-007-0213-1 |