Detector of micrometeroid and technogenic particles

Detector of micrometeroid and technogenic particles

A design is proposed of a multiparameter ionization-capacitor spherical-type solid-state particle detector based on a metal-insulator-metal (MIM) structure utilizing a large sensitive surface area. A method is presented for estimating the accuracy of the detector under noise conditions. An algorithm...

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Veröffentlicht in:Measurement techniques 1999-08, Vol.42 (8), p.719-730
Hauptverfasser: Semkin, N. D., Voronov, K. E., Rotov, S. V.
Format: Artikel
Sprache:eng
Schlagworte:
Algorithms
Detectors
Estimating
Mathematical analysis
Measurement techniques
Noise
Sensors
Studies
Surface area
Vectors (mathematics)
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Zusammenfassung:A design is proposed of a multiparameter ionization-capacitor spherical-type solid-state particle detector based on a metal-insulator-metal (MIM) structure utilizing a large sensitive surface area. A method is presented for estimating the accuracy of the detector under noise conditions. An algorithm is obtained for measuring the vector of the parameters of the investigated object and a structural scheme is developed for a measurement unit implementing the proposed algorithm.[PUBLICATION ABSTRACT]
ISSN:0543-1972
1573-8906
DOI:10.1007/BF02504351