Method of Increasing the Level of Contrast of Diffraction Extrema in Probing Deep Through Holes
A method of inspecting deep (lengthy) millimeter-range holes over near-field zone diffraction orders and a technique of constructing analogous diffraction patterns from the inlet and exit planes of the hole for two different wavelengths are considered.[PUBLICATION ABSTRACT]
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Veröffentlicht in: | Measurement techniques 2005-02, Vol.48 (2), p.166-170 |
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Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | A method of inspecting deep (lengthy) millimeter-range holes over near-field zone diffraction orders and a technique of constructing analogous diffraction patterns from the inlet and exit planes of the hole for two different wavelengths are considered.[PUBLICATION ABSTRACT] |
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ISSN: | 0543-1972 1573-8906 |
DOI: | 10.1007/s11018-005-0117-x |