Midwave thermal infrared detection using semiconductor selective absorption
The performance of thermal detectors is derived for devices incorporating materials with non-uniform spectral absorption. A detector designed to have low absorption in the primary thermal emission band at a given temperature will have a background-limited radiation noise well below that of a blackbo...
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Veröffentlicht in: | Optics express 2010-10, Vol.18 (22), p.22833-22841 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The performance of thermal detectors is derived for devices incorporating materials with non-uniform spectral absorption. A detector designed to have low absorption in the primary thermal emission band at a given temperature will have a background-limited radiation noise well below that of a blackbody absorber, which is the condition typically assessed for ultimate thermal detector performance. Specific examples of mid-wave infrared (ʎ ∼ 3-5 μm) devices are described using lead selenide as a primary absorber with optical cavity layers that maximize coupling. An analysis of all significant noise sources is presented for two example room-temperature devices designed to have detectivities up to 4.37 × 10(10) cm Hz(1/2) W(-1), which is a factor 3.1 greater than the traditional blackbody limit. An alternative method of fabricating spectrally selective devices by patterning a plasmonic structure in silver is also considered. |
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ISSN: | 1094-4087 1094-4087 |
DOI: | 10.1364/OE.18.022833 |