Genetic analysis of grain mold resistance in white seed sorghum genotypes

Grain molds in rainy season sorghums can cause poor grain quality resulting in economic losses. Grain molds are a major constraint to the sorghum production and for adoption of the improved cultivars. A complex of fungi causes grain mold. Information on genetics of grain mold resistance and mechanisms is required to facilitate the breeding of durable resistant cultivars. A genetic study was conducted using one white susceptible, three white resistant/tolerant sources, and one colored resistant source in the crossing programme to obtain four crosses. P^sub 1^, P^sub 2^, F^sub 1^, BC^sub 1^, and BC^sub 2^, and F^sub 2^ families of each cross were evaluated for the field grade and threshed grade scores, under sprinkler irrigation. Generation mean analyses and frequency distribution studies were carried out. The frequency distribution studies showed that grain mold resistance in the white-grained resistance sources was polygenic. The additive gene action and additive × additive gene interaction were significant in all the crosses. Simple recurrent selection or backcrossing should accumulate the genes for resistance. Epistasis gene interactions were observed in colored resistance × white resistance cross. Gene interaction was influenced by pronounced G × E. Pooled analysis showed that environment × additive gene interaction and environment × dominant gene interaction were significant. The complex genetics of mold resistance is due to the presence of different mechanisms of inheritance from various sources. Evaluation of segregating population for resistance and selection for stable derivatives in advanced generations in different environments will be effective.[PUBLICATION ABSTRACT]