Comparison of Tungsten Filaments by Means of the Scanning Electron Microscope

Comparison of Tungsten Filaments by Means of the Scanning Electron Microscope

The application of the scanning electron microscope to the examination of exceedingly minute striae on tungsten filaments is described. The visible spectrum is not relied upon as the mode of information transfer, allowing an examination of the striae with greatly enhanced magnification, resolution,...

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Veröffentlicht in:Journal - Forensic Science Society 1971-07, Vol.11 (3), p.197-200
Hauptverfasser: Thornton, J.I., Mitosinka, G.T., Hayes, T.L.
Format: Artikel
Sprache:eng
Schlagworte:
Accidents, Traffic
Criminology
Lighting
Microscopy, Electron, Scanning
Tungsten
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Zusammenfassung:The application of the scanning electron microscope to the examination of exceedingly minute striae on tungsten filaments is described. The visible spectrum is not relied upon as the mode of information transfer, allowing an examination of the striae with greatly enhanced magnification, resolution, and depth of focus, and with little interference from specular reflectance.
ISSN:0015-7368
DOI:10.1016/S0015-7368(71)70654-9