Discussions on the multiple-input maximum a-posteriori wave-function restoration method in high-resolution electron microscopy

The multiple‐input maximum a‐posteriori (MIMAP) wave‐function restoration method in high‐resolution electron microscopy proposed by Kirkland (1984) is further discussed. A modified MIMAP criterion that considers likely correlations between individual micrographs in a series of micrographs taken at d...

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Veröffentlicht in:	Journal of electron microscopy technique 1991-03, Vol.17 (3), p.344-350
Hauptverfasser:	Huang, Xu, Ximen, Jiye
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Electron, positron and ion microscopes, electron diffractometers and related techniques Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Microscopy, Electron Models, Statistical Multi-slice method Nonlinear iterative method Phase retrieval Physics
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Zusammenfassung:	The multiple‐input maximum a‐posteriori (MIMAP) wave‐function restoration method in high‐resolution electron microscopy proposed by Kirkland (1984) is further discussed. A modified MIMAP criterion that considers likely correlations between individual micrographs in a series of micrographs taken at different imaging conditions is presented. By performing wave‐function restoration for a multislice method‐simulated defocus series of MgO[110], the convergent properties of this modified MIMAP method are also described.
ISSN:	0741-0581 1553-0817
DOI:	10.1002/jemt.1060170308