Ultramicrotomy on fretting wear debris

Ultramicrotomy on fretting wear debris

A TEM‐sample preparation method for small amounts of fretting wear debris is presented. After embedding in a resin, the debris are ultramicrotomed to ultra‐thin sections. In this way, valuable observation of nanocrystalline fretting wear debris originating from TiN‐coatings could be rapidly obtained...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microscopy research and technique 1998-03, Vol.40 (6), p.492-494
Hauptverfasser: de Wit, E., Walet, M.A.M., Celis, J.-P.
Format: Artikel
Sprache:eng
Schlagworte:
Alloys
Materials Testing
Microscopy, Electron
Microtomy
nanocrystalline debris
preparation technique
TEM
TiN-coatings
Titanium
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A TEM‐sample preparation method for small amounts of fretting wear debris is presented. After embedding in a resin, the debris are ultramicrotomed to ultra‐thin sections. In this way, valuable observation of nanocrystalline fretting wear debris originating from TiN‐coatings could be rapidly obtained. Microsc. Res. Tech. 40:492–494, 1998. © 1998 Wiley‐Liss, Inc.
ISSN:1059-910X
1097-0029
DOI:10.1002/(SICI)1097-0029(19980301)40:6<492::AID-JEMT10>3.0.CO;2-L