A Study of Aggregation Structure in Low Dimension Non-Crystal Silicate by Low Wavenumber Raman Spectrum
The Aggregation size in the low dimension silicate series(eight samples) synthesizing via high temperature melting(MCAS, mnas) and sol-gel method (gcas,gnas) have been measured by means of low wavenumber Raman spectrum (lwrs), small-angle x-ray scattering (SAXS) and transition electron microscopy (T...
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description | The Aggregation size in the low dimension silicate series(eight samples) synthesizing via high temperature melting(MCAS, mnas) and sol-gel method (gcas,gnas) have been measured by means of low wavenumber Raman spectrum (lwrs), small-angle x-ray scattering (SAXS) and transition electron microscopy (TEM). |
doi_str_mv | 10.1063/1.3482317 |
format | Conference Proceeding |
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Xu, Peicang</creator><contributor>Ziegler, Lawrence ; Champion, Paul</contributor><creatorcontrib>Li, Rubi ; Xu, Peicang ; Ziegler, Lawrence ; Champion, Paul</creatorcontrib><description>The Aggregation size in the low dimension silicate series(eight samples) synthesizing via high temperature melting(MCAS, mnas) and sol-gel method (gcas,gnas) have been measured by means of low wavenumber Raman spectrum (lwrs), small-angle x-ray scattering (SAXS) and transition electron microscopy (TEM).</description><identifier>ISSN: 0094-243X</identifier><identifier>ISBN: 0735408181</identifier><identifier>ISBN: 9780735408180</identifier><identifier>DOI: 10.1063/1.3482317</identifier><language>eng</language><subject>Agglomeration ; Dimensional measurements ; Electron microscopy ; Light water reactors ; SAXS ; Silicates ; Small angle X ray scattering ; Sol gel process ; Transmission electron microscopy ; Wavenumber</subject><ispartof>XXII International Conference, 2010, Vol.1267, p.1099-1100</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><contributor>Ziegler, Lawrence</contributor><contributor>Champion, Paul</contributor><creatorcontrib>Li, Rubi</creatorcontrib><creatorcontrib>Xu, Peicang</creatorcontrib><title>A Study of Aggregation Structure in Low Dimension Non-Crystal Silicate by Low Wavenumber Raman Spectrum</title><title>XXII International Conference</title><description>The Aggregation size in the low dimension silicate series(eight samples) synthesizing via high temperature melting(MCAS, mnas) and sol-gel method (gcas,gnas) have been measured by means of low wavenumber Raman spectrum (lwrs), small-angle x-ray scattering (SAXS) and transition electron microscopy (TEM).</description><subject>Agglomeration</subject><subject>Dimensional measurements</subject><subject>Electron microscopy</subject><subject>Light water reactors</subject><subject>SAXS</subject><subject>Silicates</subject><subject>Small angle X ray scattering</subject><subject>Sol gel process</subject><subject>Transmission electron microscopy</subject><subject>Wavenumber</subject><issn>0094-243X</issn><isbn>0735408181</isbn><isbn>9780735408180</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNotzElLA0EUBOAGFUyiB_9B3zyNvu7X2xxDXCEoGEVvobcMI7PE6R4l_964nAqqio-QMwYXDBResgsUhiPTB2QKGqUAwww7JBOAUhRc4Nsxmab0DsBLrc2EVHO6ymPY0X5D51U1xMrmuu_25TD6PA6R1h1d9l_0qm5jl36mh74rFsMuZdvQVd3U3uZI3e739Wo_Yze2Lg70ybZ272yj31PtCTna2CbF0_-ckZeb6-fFXbF8vL1fzJfFlhmdC66kcBhEWbKNRieMdy44DiGA8wwDs9KXgiNKqXXwwloplXJOeEAMmuOMnP-526H_GGPK67ZOPjaN7WI_prU2GpRSUOI37ZBZlQ</recordid><startdate>20100101</startdate><enddate>20100101</enddate><creator>Li, Rubi</creator><creator>Xu, Peicang</creator><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20100101</creationdate><title>A Study of Aggregation Structure in Low Dimension Non-Crystal Silicate by Low Wavenumber Raman Spectrum</title><author>Li, Rubi ; Xu, Peicang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p187t-2654b3d4991f73b48cbbdb20dd0bc13d1a5c942335577dc4aa5566bb4c033d723</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Agglomeration</topic><topic>Dimensional measurements</topic><topic>Electron microscopy</topic><topic>Light water reactors</topic><topic>SAXS</topic><topic>Silicates</topic><topic>Small angle X ray scattering</topic><topic>Sol gel process</topic><topic>Transmission electron microscopy</topic><topic>Wavenumber</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Li, Rubi</creatorcontrib><creatorcontrib>Xu, Peicang</creatorcontrib><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Li, Rubi</au><au>Xu, Peicang</au><au>Ziegler, Lawrence</au><au>Champion, Paul</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A Study of Aggregation Structure in Low Dimension Non-Crystal Silicate by Low Wavenumber Raman Spectrum</atitle><btitle>XXII International Conference</btitle><date>2010-01-01</date><risdate>2010</risdate><volume>1267</volume><spage>1099</spage><epage>1100</epage><pages>1099-1100</pages><issn>0094-243X</issn><isbn>0735408181</isbn><isbn>9780735408180</isbn><abstract>The Aggregation size in the low dimension silicate series(eight samples) synthesizing via high temperature melting(MCAS, mnas) and sol-gel method (gcas,gnas) have been measured by means of low wavenumber Raman spectrum (lwrs), small-angle x-ray scattering (SAXS) and transition electron microscopy (TEM).</abstract><doi>10.1063/1.3482317</doi><tpages>2</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0094-243X |
ispartof | XXII International Conference, 2010, Vol.1267, p.1099-1100 |
issn | 0094-243X |
language | eng |
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source | 美国小型学会期刊集(AIP Scitation平台) |
subjects | Agglomeration Dimensional measurements Electron microscopy Light water reactors SAXS Silicates Small angle X ray scattering Sol gel process Transmission electron microscopy Wavenumber |
title | A Study of Aggregation Structure in Low Dimension Non-Crystal Silicate by Low Wavenumber Raman Spectrum |
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