A Study of Aggregation Structure in Low Dimension Non-Crystal Silicate by Low Wavenumber Raman Spectrum

A Study of Aggregation Structure in Low Dimension Non-Crystal Silicate by Low Wavenumber Raman Spectrum

The Aggregation size in the low dimension silicate series(eight samples) synthesizing via high temperature melting(MCAS, mnas) and sol-gel method (gcas,gnas) have been measured by means of low wavenumber Raman spectrum (lwrs), small-angle x-ray scattering (SAXS) and transition electron microscopy (T...

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Bibliographische Detailangaben
Hauptverfasser: Li, Rubi, Xu, Peicang
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Agglomeration
Dimensional measurements
Electron microscopy
Light water reactors
SAXS
Silicates
Small angle X ray scattering
Sol gel process
Transmission electron microscopy
Wavenumber
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Zusammenfassung:The Aggregation size in the low dimension silicate series(eight samples) synthesizing via high temperature melting(MCAS, mnas) and sol-gel method (gcas,gnas) have been measured by means of low wavenumber Raman spectrum (lwrs), small-angle x-ray scattering (SAXS) and transition electron microscopy (TEM).
ISSN:0094-243X
DOI:10.1063/1.3482317