Increase in φX174 DNA Radiation Sensitivity Due to Electric Fields

The application of an external electric field simultaneously with γ irradiation to an aqueous suspension of φX174 DNA (in the RFI form) is shown to increase significantly the number of strand breaks. Tritiated DNA allowed the number of single-strand breaks to be estimated from changes in the scintil...

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Veröffentlicht in:Radiat. Res.; (United States) 1985-12, Vol.104 (3), p.293-302
Hauptverfasser: McCormack, Percival D., Swenberg, Charles E.
Format: Artikel
Sprache:eng
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Zusammenfassung:The application of an external electric field simultaneously with γ irradiation to an aqueous suspension of φX174 DNA (in the RFI form) is shown to increase significantly the number of strand breaks. Tritiated DNA allowed the number of single-strand breaks to be estimated from changes in the scintillation of electrophoretic gel band associated with the fastest mobility moiety. At 400 V ($\approx 2400\ {\rm V}\ {\rm cm}^{-1}$) the corrected increase (corrected for phoresis of DNA on the stainless-steel plates) in the G-value yield is 38%. The increase in damage with field strength appears to follow the increase in reduced dichroism. Dichroism results correspond at 400 V to approximately 10% of the maximum orientation. Our results support the conjecture that this significant increase in DNA-radiation interaction with an electric field is due to field-induced conformation changes in the molecule.
ISSN:0033-7587
1938-5404
DOI:10.2307/3576591