Probing Strain-Induced Electronic Structure Change in Graphene by Raman Spectroscopy

Two-phonon Raman scattering in graphitic materials provides a distinctive approach to probing the material’s electronic structure through the spectroscopy of phonons. Here we report studies of Raman scattering of the two-dimensional mode of single-layer graphene under uniaxial stress and which impli...

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Veröffentlicht in:	Nano letters 2010-10, Vol.10 (10), p.4074-4079
Hauptverfasser:	Huang, Mingyuan, Yan, Hugen, Heinz, Tony F., Hone, James
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic structure of nanoscale materials : clusters, nanoparticles, nanotubes, and nanocrystals Exact sciences and technology Fullerenes and related materials diamonds, graphite Lattice dynamics Materials science Phonons in low-dimensional structures and small particles Physics Specific materials
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Beschreibung
Zusammenfassung:	Two-phonon Raman scattering in graphitic materials provides a distinctive approach to probing the material’s electronic structure through the spectroscopy of phonons. Here we report studies of Raman scattering of the two-dimensional mode of single-layer graphene under uniaxial stress and which implicates two types of modification of the low-energy electronic structure of graphene: a deformation of the Dirac cone and its displacement away from the K point.
ISSN:	1530-6984 1530-6992
DOI:	10.1021/nl102123c