Predictive validity of the level of expressed emotion (LEE) scale: Readmission follow-up data for 1, 2, and 5-year periods

The predictive validity of the Level of Expressed Emotion (LEE) Scale in a group of schizophrenic patients was examined. Forty‐six patients with DSM‐III diagnoses of schizophrenic disorders were administered the perceived expressed emotion measure (LEE) and followed up for a 5‐year period. Patients&...

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Veröffentlicht in:Journal of clinical psychology 1993-03, Vol.49 (2), p.216-218
Hauptverfasser: Cole, John D., Kazarian, Shahe S.
Format: Artikel
Sprache:eng
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Zusammenfassung:The predictive validity of the Level of Expressed Emotion (LEE) Scale in a group of schizophrenic patients was examined. Forty‐six patients with DSM‐III diagnoses of schizophrenic disorders were administered the perceived expressed emotion measure (LEE) and followed up for a 5‐year period. Patients' ratings of their social environments were related to rehospitalization 1 year, 2 years(p
ISSN:0021-9762
1097-4679
DOI:10.1002/1097-4679(199303)49:2<216::AID-JCLP2270490214>3.0.CO;2-G