Flash analog-to-digital converter operational in an ultra wide temperature range (room temperature to 4.2 K) in standard CMOS technology using a cryogenic reset switching scheme

This work presents the design and test result of a standard 0.7 μm CMOS flash analog-to-digital converter (ADC) operational in an ultra wide temperature range (UWT, room temperature down to 4.2 K). To maintain the circuit’s performance over the UWT range in the presence of temperature induced transi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Cryogenics (Guildford) 2009-11, Vol.49 (11), p.635-637
Hauptverfasser: Creten, Y., Merken, P., Mertens, R., Sansen, W., Van Hoof, C.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This work presents the design and test result of a standard 0.7 μm CMOS flash analog-to-digital converter (ADC) operational in an ultra wide temperature range (UWT, room temperature down to 4.2 K). To maintain the circuit’s performance over the UWT range in the presence of temperature induced transistor anomalies, dedicated topology and switching schemes are utilized. Test results mentioned in this text are from a single process run, no design iterations were made.
ISSN:0011-2275
1879-2235
DOI:10.1016/j.cryogenics.2008.12.018