Contact resistance between Au and solution-processed CNT

We have studied the contact resistance ( R C ) between Au and a solution-processed film of carbon nanotubes (CNTs). The test element group of the contact chain is modeled as a simple periodic series of resistors, the R C represents the resistor of the Au–CNT contact. The contact resistivity ( ρ C )...

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Veröffentlicht in:Solid-state electronics 2010-05, Vol.54 (5), p.586-589
Hauptverfasser: Han, Seung Hoon, Lee, Sun Hee, Hur, Ji Ho, Jang, Jin, Park, Young-Bae, Irvin, Glen, Drzaic, Paul
Format: Artikel
Sprache:eng
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Zusammenfassung:We have studied the contact resistance ( R C ) between Au and a solution-processed film of carbon nanotubes (CNTs). The test element group of the contact chain is modeled as a simple periodic series of resistors, the R C represents the resistor of the Au–CNT contact. The contact resistivity ( ρ C ) was evaluated from R C by multiplying the contact area. When the sheet resistance ( R sh ) of the CNT layer is 200 Ω/sq, the ρ C is 27 μΩ cm 2, which is ∼30 times of that of the Au–IZO contact at the same R sh . This is mainly due to the three-dimensional shape of the CNT surface, resulting in a smaller contact area on the flat surface of the Au.
ISSN:0038-1101
1879-2405
DOI:10.1016/j.sse.2010.01.010