Contact resistance between Au and solution-processed CNT
We have studied the contact resistance ( R C ) between Au and a solution-processed film of carbon nanotubes (CNTs). The test element group of the contact chain is modeled as a simple periodic series of resistors, the R C represents the resistor of the Au–CNT contact. The contact resistivity ( ρ C )...
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Veröffentlicht in: | Solid-state electronics 2010-05, Vol.54 (5), p.586-589 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We have studied the contact resistance (
R
C
) between Au and a solution-processed film of carbon nanotubes (CNTs). The test element group of the contact chain is modeled as a simple periodic series of resistors, the
R
C
represents the resistor of the Au–CNT contact. The contact resistivity (
ρ
C
) was evaluated from
R
C
by multiplying the contact area. When the sheet resistance (
R
sh
) of the CNT layer is 200
Ω/sq, the
ρ
C
is 27
μΩ
cm
2, which is ∼30 times of that of the Au–IZO contact at the same
R
sh
. This is mainly due to the three-dimensional shape of the CNT surface, resulting in a smaller contact area on the flat surface of the Au. |
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ISSN: | 0038-1101 1879-2405 |
DOI: | 10.1016/j.sse.2010.01.010 |