Vector two-tone measurements for validation of non-linear microwave FinFET model

Vector two-tone measurements for validation of non-linear microwave FinFET model

The goal of this paper is to demonstrate the added value of vector two-tone measurements in validating a microwave transistor model. By having the phase information of the low frequency intermodulation products, the model can be evaluated completely both in frequency and time domain. The approach is...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microelectronic engineering 2010-10, Vol.87 (10), p.2008-2013
Hauptverfasser: Crupi, Giovanni, Avolio, Gustavo, Schreurs, Dominique M.M.-P., Pailloncy, Guillaume, Caddemi, Alina, Nauwelaers, Bart
Format: Artikel
Sprache:eng
Schlagworte:
Added value
Applied sciences
Electronics
Equivalent circuit model
Exact sciences and technology
FinFET
Intermodulation
Intermodulation distortion
Low frequencies
Mathematical analysis
Microelectronics
Microwave and submillimeter wave devices, electron transfer devices
Microwaves
Nonlinearity
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Transistors
Two-tone measurements
Vectors (mathematics)
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The goal of this paper is to demonstrate the added value of vector two-tone measurements in validating a microwave transistor model. By having the phase information of the low frequency intermodulation products, the model can be evaluated completely both in frequency and time domain. The approach is illustrated on a non-dispersive FinFET.
ISSN:0167-9317
1873-5568
DOI:10.1016/j.mee.2009.12.075