Specific Exafs Tools in Analysis of MoSI Nanowires

Specific Exafs Tools in Analysis of MoSI Nanowires

The structure of nanowires prepared by vapor synthesis from Mo, S and I is investigated by methods of x-ray diffraction (XRD) and extended x-ray absorption fine structure (EXAFS). Starting with a qualitative model of the structure from XRD, the metrics is introduced with interatomic distances determ...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Acta chimica Slovenica 2006-01, Vol.53 (1)
Hauptverfasser: Kodre, A, Gomilsek, J P, Arcon, I, Meden, A, Mihailovic, D
Format: Artikel
Sprache:eng
Schlagworte:
Diffraction
Fine structure
Interatomic distance
Mathematical models
Nanowires
Reciprocity
Stoichiometry
X-rays
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The structure of nanowires prepared by vapor synthesis from Mo, S and I is investigated by methods of x-ray diffraction (XRD) and extended x-ray absorption fine structure (EXAFS). Starting with a qualitative model of the structure from XRD, the metrics is introduced with interatomic distances determined from EXAFS. Two specific tools to increase the resolution of EXAFS method are discussed: the reciprocity relation between data from adjacent target atoms, and difference EXAFS from data on samples with small changes in stoichiometry.
ISSN:1318-0207